We design, manufacture and assess the contact probes used for inspecting electrical characteristics in semiconductor manufacturing processes.
- Micro machining technology making the fullest use of Citizen’s automatic lathe technology
- Originally developed assembly technology for extremely small parts
- Integrated manufacture of products thinner than a human hair to meet customer requirements, from design, component machining, surface treatment and assembly right through to assessment
- Solution type proposals for improving contacts based on analysis/development technology
We aim to address the needs of our customers based on our experience dealing with several hundred types.
- Outer diameter φ0.1 to 1 mm
- We handle customized manufacture.
Example of actual assessment equipment
Particulars / Specifications
Please consult us about your requirements.