Contact Probe

Features

We design, manufacture and assess the contact probes used for inspecting electrical characteristics in semiconductor manufacturing processes.

  • Micro machining technology making the fullest use of Citizen’s automatic lathe technology
  • Originally developed assembly technology for extremely small parts
  • Integrated manufacture of products thinner than a human hair to meet customer requirements, from design, component machining, surface treatment and assembly right through to assessment
  • Solution type proposals for improving contacts based on analysis/development technology

We aim to address the needs of our customers based on our experience dealing with several hundred types.

Applications

Lineup

  • Outer diameter φ0.1 to 1 mm
  • We handle customized manufacture.


Component machining


Assembly


Inspection


Example of actual assessment equipment

Particulars / Specifications

Please consult us about your requirements.